trisquel@trisquel:~$ sudo smartctl -t long /dev/sda

smartctl 6.2 2013-07-26 r3841 [i686-linux-3.13.0-39-lowlatency] (local build)

Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF OFFLINE IMMEDIATE AND SELF-TEST SECTION ===

Sending command: "Execute SMART Extended self-test routine immediately in off-line mode".

Drive command "Execute SMART Extended self-test routine immediately in off-line mode" successful.

Testing has begun.

Please wait 154 minutes for test to complete.

Test will complete after Sat Oct 24 00:08:26 2015

Use smartctl -X to abort test.

trisquel@trisquel:~$ sudo smartctl -a /dev/sda

smartctl 6.2 2013-07-26 r3841 [i686-linux-3.13.0-39-lowlatency] (local build)

Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===

Model Family: Western Digital Caviar Blue Serial ATA

Device Model: WDC WD5000AAJS-00YFA0

Serial Number: WD-WCAS85855212

LU WWN Device Id: 5 0014ee 2abbde835

Firmware Version: 12.01C02

User Capacity: 500,107,862,016 bytes [500 GB]

Sector Size: 512 bytes logical/physical

Device is: In smartctl database [for details use: -P show]

ATA Version is: ATA8-ACS (minor revision not indicated)

SATA Version is: SATA 2.5, 3.0 Gb/s

Local Time is: Sat Oct 24 02:11:36 2015 UTC

SMART support is: Available - device has SMART capability.

SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===

SMART overall-health self-assessment test result: PASSED

General SMART Values:

Offline data collection status: (0x84) Offline data collection activity

was suspended by an interrupting command from host.

Auto Offline Data Collection: Enabled.

Self-test execution status: ( 121) The previous self-test completed having

the read element of the test failed.

Total time to complete Offline

data collection: (13200) seconds.

Offline data collection

capabilities: (0x7b) SMART execute Offline immediate.

Auto Offline data collection on/off support.

Suspend Offline collection upon new

command.

Offline surface scan supported.

Self-test supported.

Conveyance Self-test supported.

Selective Self-test supported.

SMART capabilities: (0x0003) Saves SMART data before entering

power-saving mode.

Supports SMART auto save timer.

Error logging capability: (0x01) Error logging supported.

General Purpose Logging supported.

Short self-test routine

recommended polling time: ( 2) minutes.

Extended self-test routine

recommended polling time: ( 154) minutes.

Conveyance self-test routine

recommended polling time: ( 5) minutes.

SCT capabilities: (0x303f) SCT Status supported.

SCT Error Recovery Control supported.

SCT Feature Control supported.

SCT Data Table supported.

SMART Attributes Data Structure revision number: 16

Vendor Specific SMART Attributes with Thresholds:

ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE

1 Raw_Read_Error_Rate 0x000f 200 200 051 Pre-fail Always - 0

3 Spin_Up_Time 0x0003 180 178 021 Pre-fail Always - 5958

4 Start_Stop_Count 0x0032 092 092 000 Old_age Always - 8252

5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0

7 Seek_Error_Rate 0x000e 200 200 051 Old_age Always - 0

9 Power_On_Hours 0x0032 081 081 000 Old_age Always - 14242

10 Spin_Retry_Count 0x0012 100 100 051 Old_age Always - 0

11 Calibration_Retry_Count 0x0012 100 100 051 Old_age Always - 0

12 Power_Cycle_Count 0x0032 098 098 000 Old_age Always - 2400

192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 151

193 Load_Cycle_Count 0x0032 198 198 000 Old_age Always - 8252

194 Temperature_Celsius 0x0022 119 087 000 Old_age Always - 31

196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0

197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 10

198 Offline_Uncorrectable 0x0010 200 200 000 Old_age Offline - 5

199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0

200 Multi_Zone_Error_Rate 0x0008 200 200 051 Old_age Offline - 1

SMART Error Log Version: 1

ATA Error Count: 24 (device log contains only the most recent five errors)

CR = Command Register [HEX]

FR = Features Register [HEX]

SC = Sector Count Register [HEX]

SN = Sector Number Register [HEX]

CL = Cylinder Low Register [HEX]

CH = Cylinder High Register [HEX]

DH = Device/Head Register [HEX]

DC = Device Command Register [HEX]

ER = Error register [HEX]

ST = Status register [HEX]

Powered_Up_Time is measured from power on, and printed as

DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,

SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 24 occurred at disk power-on lifetime: 14235 hours (593 days + 3 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 08 e0 dc c6 e0 Error: UNC 8 sectors at LBA = 0x00c6dce0 = 13032672

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

25 00 08 e0 dc c6 1c 08 00:56:28.202 READ DMA EXT

25 00 28 30 de c6 1c 08 00:56:28.201 READ DMA EXT

25 00 80 b0 dd c6 1c 08 00:56:28.201 READ DMA EXT

25 00 20 68 dd c6 1c 08 00:56:28.201 READ DMA EXT

25 00 80 e8 dc c6 1c 08 00:56:28.191 READ DMA EXT

Error 23 occurred at disk power-on lifetime: 14235 hours (593 days + 3 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 20 c8 dc c6 e0 Error: UNC 32 sectors at LBA = 0x00c6dcc8 = 13032648

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

25 00 20 c8 dc c6 1c 08 00:56:24.867 READ DMA EXT

25 00 08 c0 dc c6 1c 08 00:56:24.866 READ DMA EXT

25 00 20 68 dc c6 1c 08 00:56:24.866 READ DMA EXT

25 00 08 60 dc c6 1c 08 00:56:24.866 READ DMA EXT

25 00 20 f8 db c6 1c 08 00:56:24.865 READ DMA EXT

Error 22 occurred at disk power-on lifetime: 14235 hours (593 days + 3 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 f0 d0 dc c6 e0 Error: UNC 240 sectors at LBA = 0x00c6dcd0 = 13032656

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

25 00 f0 d0 dc c6 1c 08 00:49:01.205 READ DMA EXT

25 00 08 c8 dc c6 1c 08 00:49:01.205 READ DMA EXT

25 00 08 c0 dc c6 1c 08 00:49:01.205 READ DMA EXT

25 00 f0 98 db c6 1c 08 00:49:01.203 READ DMA EXT

25 00 08 90 db c6 1c 08 00:49:01.203 READ DMA EXT

Error 21 occurred at disk power-on lifetime: 14235 hours (593 days + 3 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 f0 d0 dc c6 e0 Error: UNC 240 sectors at LBA = 0x00c6dcd0 = 13032656

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

25 00 f0 d0 dc c6 1c 08 00:32:50.638 READ DMA EXT

25 00 08 c8 dc c6 1c 08 00:32:50.638 READ DMA EXT

25 00 08 c0 dc c6 1c 08 00:32:50.638 READ DMA EXT

25 00 f0 98 db c6 1c 08 00:32:50.636 READ DMA EXT

25 00 08 90 db c6 1c 08 00:32:50.636 READ DMA EXT

Error 20 occurred at disk power-on lifetime: 14235 hours (593 days + 3 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 f0 d0 dc c6 e0 Error: UNC 240 sectors at LBA = 0x00c6dcd0 = 13032656

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

25 00 f0 d0 dc c6 1c 08 00:01:02.392 READ DMA EXT

25 00 08 c8 dc c6 1c 08 00:01:02.392 READ DMA EXT

25 00 08 c0 dc c6 1c 08 00:01:02.392 READ DMA EXT

25 00 f0 98 db c6 1c 08 00:01:02.390 READ DMA EXT

25 00 08 90 db c6 1c 08 00:01:02.390 READ DMA EXT

SMART Self-test log structure revision number 1

Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error

SMART Selective self-test log data structure revision number 1

SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS

1 0 0 Not_testing

2 0 0 Not_testing

3 0 0 Not_testing

4 0 0 Not_testing

5 0 0 Not_testing

Selective self-test flags (0x0):

After scanning selected spans, do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up, resume after 0 minute delay.